ST400 Optical Profilometer from NANOVEA

150mm X-Y stages and a large coarse height adjustment to easily accommodate larger sample sizes.The ST400 also has an optional offset camera, with either manual or motorized zooms, to easily identify small features prior to measuring them. The Custom ST400, a more open configuration, allows for the addition of larger X-Y stages to measure even larger areas, a 360° rotational stage for measuring spherical or cylindrical parts and many other custom configurations. Works well for larger samples and larger scan areas. Available with various automation options. Ideal option for diverse and expanding measurement needs.

Key Features

  • 150mm x 150mm XY
  • Various Options
  • Spacious Platform Area for Unique Sample Size
  • (PRVision) Image Pattern Recognition

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