Nano Tribometer (NTR2) for Characterizing the Properties of Surfaces at Low Contact Pressures

The Nano Tribometer (NTR2) has been developed to distinguish the tribological properties of a broad range of surfaces at low contact pressures. The instrument provides precise and extremely linear measurements of both tangential and normal forces. To do this the NTR2 uses an elastic double beam cantilever combined with high-resoultion capacitive sensors.

The NTR2 combines the resolution of an atomic force microscope (AFM) with the robustness, stability, and ease-of-use of a pin-on-disk tribometer. It enables a new dimensions of nano- and micro-tribology. The tribometer extends the applications of a pin-on-disk system, and can handle forces in the range of a few µN and displacements in the range of hundreds of microns.

Key Features

The main features of the Nano Tribometer are listed below:

  • Unique dual beam cantilever with normal load applied up to 1000 mN (resolution 3 nN)
  • Two independent high-resolution capacitive sensors for normal load and friction force
  • High-resolution capacitive sensors combined with Piezo actuator
  • Low noise floor for micro-tribological measurements
  • Rotative module with angular sensor
  • Humidity sensor
  • Linear and/or rotative reciprocating motion
  • Innovative linear module with displacement sensor
  • Broad range of cantilevers are available
  • Adhesion measurements
  • X and Y motorized stage
  • Temperature and relative
  • AFM or optical video microscope
  • Continuous wear depth measurement
  • Specially designed sample holders

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