GOLDEN Series AFM Probes

The Golden series of AFM probes has standard chip-console-tip shape and dimensions, making them ideally suited for routine measurements of topography and elasticity characteristics of samples. With a curvature radius of below 10nm, these probes yield good lateral resolution.

Chips can be used with all standard AFM probe holders. The Golden series of AFM probes may also come with or without reflective side and tip side coating, tipless and with submicron spheres coupled.

Specifications

The key specifications of the Golden series of AFM probes are given below:

Material Single Crystal Silicon, N-Type, 0.01-0.025 Ohm-cm, Antimony doped
Chip size 3.4 x 1.6 x 0.3mm
Reflective side Au
Cantilever number 1 rectangular
Tip curvature radius Typical 6 nm, guaranteed 10nm
Available coatings Conductive PtIr, TiN, Au;
Magnetic CoCr
Available probe Bare, tipless, with Al reflective coating

Application Field

The Golden series of AFM probes is used for high-quality topography measurements and elastic properties measurements.

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