The Golden series of AFM probes has standard chip-console-tip shape and dimensions, making them ideally suited for routine measurements of topography and elasticity characteristics of samples. With a curvature radius of below 10nm, these probes yield good lateral resolution.
Chips can be used with all standard AFM probe holders. The Golden series of AFM probes may also come with or without reflective side and tip side coating, tipless and with submicron spheres coupled.
The key specifications of the Golden series of AFM probes are given below:
||Single Crystal Silicon, N-Type, 0.01-0.025 Ohm-cm, Antimony doped
||3.4 x 1.6 x 0.3mm
|Tip curvature radius
||Typical 6 nm, guaranteed 10nm
||Conductive PtIr, TiN, Au;
||Bare, tipless, with Al reflective coating
The Golden series of AFM probes is used for high-quality topography measurements and elastic properties measurements.