NTEGRA Spectra II: Versatile Automated AFM-Raman, TERS and SNOM System

Since 1998 the NT-MDT has been effectively integrating AFM with spectroscopy and optical microscopy methods. There are over 30 essential and modern AFM modes supported, including HybriD ModeTM. These modes offer vast data regarding the sample surface physical properties.

Combining AFM along with confocal Raman/fluorescence microscopy offers the broadest range of extra data about the sample. Concurrently measured Raman and AFM maps of precisely the same sample area offer corresponding data about chemical composition (Raman) and sample physical properties (AFM).

Due to Tip Enhances Raman Scattering (TERS), the NTEGRA Spectra II permits execution of microscopy/spectroscopy with nanometer scale resolution.

Scanning near-field optical microscopy (SNOM) is an additional approach to acquire spectroscopy and optical images of optically active samples together with resolution restricted by probe aperture size of ~100nm.

Key Features

The main features of the NTEGRA Spectra II are as follows:

  • Optical access from top, bottom and side optimized for TERS
  • High-performance flexible AFM
  • Adaptable optical design offering any combination of collection/excitation configurations
  • Automatic AFM laser, photodiode and probe alignment

Applications

The applications of the NTEGRA Spectra II are as follows:

  • G band intensity
  • Topography
  • Raman spectra
  • 2D band intensity

Working Principle

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