® has introduced the ZeGage™ Plus, which is a 3D optical surface profiler available with sub-nanometer precision. The ZeGage™ Plus expands on the capabilities of the ZeGage™ profiler with an increased range of measurable surfaces, higher precision, and faster measurement speed, while maintaining its small footprint, ease of use, and vibration insensitivity.
This new optical profiler is capable of measuring a wide variety of surfaces, ranging from very smooth to extremely rough, with sub-nanometer precision and independent of field of view. Surface finishes could include honed, lapped, ground, polished, and super-polished on materials such as metal, glass, and ceramic.
The ZeGage™ Plus scans up to twice as fast as the ZeGage™ for high-speed measurements, thus providing faster time-to-data for production metrology and increased throughput.
With reference to the ZeGage™ profiler, the Mx™ interactive control software provides comprehensive and simple visualization to enable users control their process.
Fully-automated and field stitching measurement sequences enable high resolution inspection of large areas (optional motorized part stage is needed)
Exceptional gage capability is available with quantitative surface metrology and sub-nanometer precision
Correlates to both 3D and 2D standards, and adheres to surface roughness parameters of ISO 25178
High-resolution one million pixel image sensor provides rapid areal measurements within seconds, for superior visualization and surface detail
Built-in focus and autofocus aid simplification of part setup and reduce operator variability
Proprietary non-contact measurement technology has low sensitivity to vibration effects, which eliminates the requirement for vibration isolation platforms in an increasing number of applications
Selectable field-of-view and magnification, with a wide range of system and imaging options
Measures a variety of surface materials and finishes, from highly smooth to rough, such as steep slopes and large steps
Area-based measurement is not sensitive to part lay
Included Mx™ software offers comprehensive tools for visualization, analysis, and reporting of surface data
3D and 2D profiling of step-height, surface texture, form and more
Non-contact metrology method prevents part damage
Productivity and Value
Consumables are not required for measurements
Simplified operation results in low service and training costs
Cost-effective price-to-performance ratio compares well to alternative systems, such as mechanical contact stylus profilers
Durable, high-output LED light source for years of problem-free operation
Non-contact technique means that there are no consumable replacement costs to be concerned about
Vibration-tolerant, compact SureScan™ technology enables effortless integration anywhere in the user’s facility
The key features of the ZeGage™ Plus
Vibration-resistant, for process control and production floor metrology
Measures all surfaces ranging from super-smooth to rough
Up to 2X faster vertical scan rate over standard ZeGage™
More than 20X better surface topography repeatability when compared with standard ZeGage™
Mx Software Screen