Compact Tabletop SEM with Dual Imaging Detectors: SNE-3200M

The SNE-3200M is a mid-range tabletop scanning electron microscope (SEM) with three-axis stage control and dual imaging detectors (SE/BSE) standard. Low vacuum capability for non-conductive samples is added. The SNE-3200 series Tabletop SEM matches or surpasses the imaging capabilities of all other commercially available tabletop SEMs with the exception of the SNE-4500M.

The compact SNE-3200M is a versatile microscope that can be easily used for engineering staff, quality control workflows, and even in educational environments because of its robust design and user-friendly software.

Optionally, the SNE-3200M can be offered with some features eliminated, making the SNE-3200M the most economical SEM on the market.

Advanced options available:

EDS elemental analysis – cooling stage – anti-vibration table

Imaging Performance

  • Resolution – 15 nm
  • Beam energy - 1 – 30 kV
  • Magnification (Live) - 60,000x
  • Multi detectors - SE / BSE

SE (Secondary Electron) Imaging

Capture images with surface and topographic details

BSE (Back-Scattered Electron) Imaging

Capture images with material composition information (Atomic Weight Contrast imaging)

Convenience and Ease-of-Use

Stage System

  • X,Y,R (three-axis) – standard
  • Beam shift:150 µm
  • X,Y,T (three-axis) – optional

Auto Setting

  • Brightness / contrast
  • Start (filament saturation)
  • Focus / stigmator

Viewing Modes

  • Secondary electron (SE)
  • Dual view SE/BSE multi display
  • Backscatter electron (BSE)

Easy specimen positioning is accomplished via movement of the manual three-axis stage. A broad variety of sample holders are available to house any type of sample. The software offers the beginner user a simple and clean interface that is not cluttered while the more advanced user can easily access features allowing additional control of the microscope operations.

Using the smart software, users can view and save either SE or BSE images, or as a composite image incorporating both SE+BSE as illustrated below. This composite image provides a significant tool for investigative analysis by offering both topographical (SE) and composition (BSE) data in a single image.

Furthermore, the software allows viewing both SE and BSE images in a dual view mode or side-by-side mode.

Specifications

ELECTRON BEAM SYSTEM
Resolution 15 nm (30 kV, SE Image)
20 nm (30 kV, BSE Image)
Accelerating Voltage 1~30 kV (1/5/10/15/20/30)
Detector Secondary Electron Image(SE)
Backscattered Electron Image(BSE)
Electron Gun Pre-centered Tungsten Filament Cartridge
IMAGING FEATURES
Automatic Functions Auto Start, Auto Focus
Auto Stigmator, Auto Contrast & Brightness
Magnification (Live) 20X~60,000X
Magnification (Saved) > 500,000X (theoretical)
Image Capture Sizes 5120 x 3840
2560 x 1920
1280 x 960
640 x 480
320 x 240
Image Formats BMP, JPEG, PNG, TIFF
Image Annotation 2-point length
multi-point length
angle measurement
diameter measurement
area measurements
arrow/rectangle marking
text annotations
STAGE SYSTEM
Stage Traverse 3-axis System (X, Y, R - Manual)
X, Y-axis : ±35 mm
R-axis : 360°
* Image Shift : ±150 µm
* T-axis : 0 to 45° (Optional - replaces R-axis)
Maximum Sample Size 70 mm in Diameter x 30 mm in Height
VACUUM SYSTEM
Vacuum Modes High & Low Vacuum (Charge Reduction)
Roughing Vacuum Pump Rotary Vane Pump (standard)
Pfeiffer Diaphragm Pump (optional)
High Vacuum Pumps Pfeiffer HiPace Turbo Molecular Pump
DIMENSIONS
Main Unit 390(W) x 380(D) x 560(H) mm, 83 kg
Controller Unit 390(W) x 325(D) x 560(H) mm, 37 kg
Rotary Pump 400(W) x 160(D) x 340(H) mm, 24 kg

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