XFlash® 630 EDS with ESPIRIT Compact Software

The Bruker XFlash® 630 EDS with ESPRIT Compact software is designed for simple or advanced elemental micro-analysis.

Incorporating EDS to the customer’s tabletop SEM converts it into a very powerful analytical tool allowing numerous capabilities using advanced microanalysis features for elemental analysis. With the conical pole piece design of the SNE-3200 and SNE-4500, the EDS signal is gathered at the optimal solid angle in contrast to other tabletop SEM designs that have a flat or near-flat construction for the pole piece (electron beam exit to the sample chamber).

The Bruker ESPRIT Compact software offers several capabilities for probing the samples thickness, composition, and mapping as shown in the screenshots and explanations below.

Further upgrading to the Bruker QUANTAX 200 software for highly advanced capabilities is possible. They include:

  • Metal Inclusion Analysis (Steel Cleanliness – ASTM E1245/E2142/E45)
  • Gun Shot Residue – GSR (ASTM E1588)
  • Mineral Phase Analysis, Mineral Liberation, Modal Mineralogy, Petrography
  • General Particle Analysis for Cleanliness (ISO 16431/18413, IEST 1246D)
  • Environmental Particles on Filters or Wipes (ASTM D6059, ASTM E2090, ISO 14966)
  • Wear Particle Analysis (ARP 598c, ASTM D7416, ASTM F311/F312, ISO 16232-8, ISO 4407)
  • Particulate Contamination in Injections and Parenteral Infusions (USP 788)

The Bruker Quantax 200 software offers a number of dedicated modules and databases to help with completing these common types of analysis normally only possible with full-size SEM but presently possible with TableTop SEM systems like the SNE-3200P or SNE4500P .


Main Specifications of XFlash® 630 EDS H for Tabletop SEM

  • Detector area: 30 mm
  • High-speed embedded type SDD Dectector (No LN2 required)
  • Energy resolution: Less than 129 eV (at Mn Ka)
  • Maximum input count rate: > 150 kcps
  • Element detection range: B(5) – Am(95)
  • Software: Qualitative or quantitative analysis
  • Analysis Modes: point, circle, polygon, line scan, mapping


Point / Area Composition

  • The software has easy to use features for composition analysis at points, circles, rectangles, and polygons
  • Quick and accurate quantitative or qualitative analysis with calibration capability is standard
  • Enhanced deconvolution capabilities significantly enhance quantified results


  • Quick and high-resolution mapping analysis with Bruker’s HyperMap
  • Mapping offers the function of analyzing the distribution of elements
  • Maps of individual element distribution can be broken out and saved individually
  • Spectra for each pixel are saved in a database for later use and manipulation of point or line scan analysis
  • Various user settings for saving formats, depth, colors, filters, and more

Line Scan

  • Draw ROI (region of interest) with a line and analyze elements along that line
  • Easy to compare the elemental difference along ROI with line profile graph
  • Very beneficial for cross-section thickness analysis of multi-layer samples including the mixing zone
  • A variety of user settings for saving formats, line scan width, colors, filters, and more


  • Various reporting formats are provided that can be edited as preferred
  • One-click saving of reports in Word or PDF

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