Nanoscale Infrared Imaging with S-SNOM and AFM-IR – nanoIR2-s

Setting a New Standard for Nanoscale IR Spectroscopy and Imaging

  • nano FTIR provides high performance broadband spectroscopy
  • 10 nm spatial resolution optical and chemical imaging
  • Nanoscale property mapping with full featured AFM
  • Two complementary nanoIR methods: s-SNOM and AFM-IR
  • “Anasys Engineered" for reliability and productivity

High Performance nano FTIR Spectroscopy

  • nano FTIR spectroscopy comes with integrated DFG, continuum-based laser source
  • Highest performance IR SNOM spectroscopy with the most sophisticated nanoIR laser source
  • Multi-chip QCL laser source for chemical imaging and spectroscopy
  • Broadband synchrotron light source integration

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Applications of s-SNOM

s-SNOM is used for a wide range of applications including graphene and novel 2D materials with spatial resolution down to 10 nm.

hBN Phonon-Polaritons

Nano imaging of surface phonon polaritons (SPhP) on hexagonal boron nitride (hBN). (a) AFM height image shows homogeneous hBN surface with different layers on Si substrate; (b) s-SNOM amplitude shows strong interference fringes due to propagating SPhP along the surface on hBN; (c) s-SNOM phase shows a difference phase with layer thickness. From the image b and c, we can also see the wavelength of the SPhP changes with the number of layers.

Graphene Plasmonics

s-SNOM phase and amplitude images of surface plasmon polariton (SPP) on a graphene wedge. (left) 3D view of Phase image. (center) s-SNOM phase with a line cross-section of the SPP standing wave; (right) s-SNOM amplitude.

Life Sciences

s-SNOM measurements of purple membrane reveal distribution of protein within the lipid membrane. AFM height (left); s-SNOM phase image with IR source tuned to the amide I absorption band (center); s-SNOM phase image off-resonance (right).

Combine s-SNOM and AFM-IR to Create Remarkable New Data

For the first time, complementary AFM-IR and Scattering SNOM images demonstrate the microscale origins of optical chirality on plasmonics structures.

Unique and complementary plasmonic properties can be achieved by accessing the radiative (s-SNOM) and non-radiative (AFM-IR) information on plasmonics structures. Khanikaev et al., Nat. Comm. 7, 12045 (‘16). Doi:10.1038/ncomms12045.

s-SNOM Imaging of Multi-Layer Nylon and PE Sample

s-SNOM can be employed to measure multi-layer polymeric films. In the below figure, absorption bands at 1640 and 1540 cm-1 were seen for nylon. Subsequent s-SNOM imaging at 1640 cm-1 demonstrated contrast between the nylon layer and PE layer. Sample provided courtesy of DSM.

Unique AFM Capabilities

The AFM provides correlated property mapping with nano-mechanics, nano-electrical, nano-chemical, nano-thermal and topography.

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Versatile, Full Featured AFM

Each product in the Anasys Instruments family is developed around the company’s full featured AFM supporting numerous routinely used AFM imaging modes, such as CAFM, MFM, EFM, force modulation, lateral force, force curves, contact, phase, tapping and more.

Tapping image of block copolymer.

Force modulation of polymer blend.

Magnetic force microscopy of a magnetic tape.

Tapping phase image of polymer nanocomposite.

Mechanical Spectroscopy and Imaging

Broadband nanomechanical spectra utilizing Lorentz Contact Resonance (LCR) provides valuable information about differences in material stiffness, friction and viscosity. LCR provides sensitive material contrast on materials that range from soft polymers to hard inorganics and semiconductors.

Nanomechanical spectra (left) discriminate materials on the basis of stiffness and damping. Examples of LCR stiffness maps on complex polymer blends (center) and high performance paper products (right).

Nanoscale Thermal Analysis (nanoTA)

This award-winning technology, developed by Anasys Instruments, employs Anasys ThermaLever™ probes to locally increase the temperature of the sample in order to map and measure thermal transitions and other thermal properties.

Left: nanoTA uses a heated AFM tip to measure glass transition and melt temperatures with nanoscale spatial resolution. Middle: Thermal transition curves on a 21 layer laminated polymer film. Right: Scanning thermal microscopy visualizes variations in temperature and thermal conductivity on a sectioned circuit board.

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