AFM Probe for Material Sciences Applications: Scout 350

The NuNano Scout 350 can be ordered in a pack of 10 general purpose, silicon AFM probes. The Scout 350 probes are perfect for non-contact/tapping mode imaging of stable, soft samples such as a bipolymers or hard samples in air for example a silicon substrate, for materials science and biomaterials applications. Scout 350 probes can be ordered without a coating or with either an aluminum or gold reflex backside coating.

Feature Highlights

  • Spring Constant range: 25-70 N/m
  • Resonant Frequency range: 300-400 kHz
  • Rectangular shape
  • Length range: 123-127 µm
  • Width range: 28-32 µm
  • Thickness range: 4.0-5.0 µm
  • Material: Silicon (n-type, antimony)
  • Resistivity: 0.015-0.025 Ωcm

Tip Specifications

  • Radius range: < 10 nm
  • Height range: 5-8 µm
  • Set back range: 6.5-8.5 µm
  • Conical shape
  • Cone Angle range: 15-40°
  • Material: n-type antimony silicon
  • Resistivity: 0.015-0.025 Ωcm

Optional Reflective Coatings

  • Aluminium (SCOUT 350 RAl): Frontside/Tip - None, Backside/Reflective - 40 nm Al
  • Gold (SCOUT 350 RAu): Frontside/Tip - None, Backside/Reflective - 5 nm Ti, 50 nm Au

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