Helios G4 PFIB DualBeam for Materials Science

The Helios G4 PFIB enables breakthroughs in innovation with DualBeam™ technology. It delivers unrivalled capabilities for large volume 3D characterization and is able to handle Ga+ free sample preparation and precise micromachining quickly and easily.

Part of the fourth generation of the Helios DualBeam™ family, The Helios G4 PFIB combines the Monochromated Elstar™ SEM column and the new PFIB 2.0 column to offer unprecedented, advanced performance of its focused ion and electron beams.

Intuitive software coupled with industry leading ease-of-use and automation functionality can be used to support engineers and scientists in the analysis and observation of relevant subsurface volumes.

Models Available

CXe

  • High quality, large volume 3D characterization, micromachining and cross sectioning can be performed with the next-generation 2.5 μA Xenon Plasma FIB (PFIB 2.0) Column.
  • Multi-modal subsurface and 3D information can be accessed with precise targeting via the optional Thermo Scientific™ Auto Slice & View™ 4 (AS&V4) Software.
  • Ga+ free TEM samples can be prepared due to the PFIB 2.0 Column’s high performance in all operating conditions. The device also offers a guided TEM sample preparation workflow.
  • The Elstar™ SEM Electron Column reveals the finest of details by using high current UC+ monochromator technology. The device also delivers sub-nanometer performance at low energies.
  • A highly flexible 110 mm stage guarantees precise sample navigation that can be adapted to a range of individual application needs.

UXe

  • High quality, large volume 3D characterization, micromachining and cross sectioning can be performed with the next-generation 2.5 μA Xenon Plasma FIB (PFIB 2.0) Column.
  • Multi-modal subsurface and 3D information can be accessed with precise targeting via the optional Thermo Scientific™ Auto Slice & View™ 4 (AS&V4) Software.
  • Ga+ free TEM samples can be prepared using the PFIB 2.0 Column’s high performance in all operating conditions. The device also offers a guided TEM sample preparation workflow.
  • The Elstar™ SEM Electron Column reveals the finest of details by using high current UC+ monochromator technology. The device also delivers sub-nanometer performance at low energies.
  • A highly flexible 150 mm Piezo stage guarantees precise sample navigation that can be adapted to a range of individual application needs.

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