The Thermo Scientific Helios™ NanoLab™ DualBeam™ microscope has always incorporated the company’s best electron and ion optics, software, and accessories to provide a robust solution for cutting-edge nanoscale research. For researchers working at nanotechnology's leading edge, the Thermo Scientific Helios NanoLab DualBeam allows them to push boundaries and develop new possibilities for materials research.
With greatly valued sub-nm SEM imaging, the ability to create ultra-thin samples for S/TEM, and the most precise prototyping capabilities, researchers choose to work with the Thermo Scientific Helios NanoLab DualBeam for innovating new materials and nanoscale systems that will impact future advancements.
Helios NanoLab DualBeam for Materials Science
In materials science, the challenge for scientists is to persistently enhance the quality of materials and devices being built these days. Understanding compositional and structural details down to the nanoscale is vital to realizing technology advancements. The Thermo Scientific Helios NanoLab DualBeam is engineered to offer multi-scale, multi-dimensional insights, down to sub-nm resolution, to allow scientists to visualize the minutest details of their sample. Furthermore, the Helios NanoLab DualBeam speedily produces the highest quality samples for atomic resolution S/TEM imaging. In cases where the research includes building NEMS or MEMS devices, the Helios NanoLab DualBeam can be fitted to create completely functional prototypes.
Helios NanoLab DualBeam for Semiconductors
The Helios NanoLab DualBeam is a very flexible platform providing both high-performance low kV imaging and high productivity TEM sample preparation for advanced logic and memory device analysis. Available in both small and large chamber configurations, which enable high efficiency, the Helios Nanolab DualBeam is an important component of Thermo Fisher's low cost per sample semiconductor analysis workflows for both near-fab environments and laboratory.