Highly Conductive Diamond Probe - CS-A-E2.8
CS Instruments produces diamond probes which are highly conductive. These are manufactured using a patented process which yields the greatest possible resistance to wear and the best electrical performance. As a result these tips have improved sharpness and longer life than other electrical AFM probes.
The characteristics of various tips are summarized in the tables below:
Bulk Tip
| . |
. |
| Tip Shape |
4 Sided Pyramid |
| Height |
12.5 ± 2.5 um |
| Front Angle (FA) |
25 ± 5 degrees |
| Back Angle (SA) |
15 ± 5 degrees |
| Side Angle (SA) |
22.5 ± 5 degrees |
| Tip Setback (TSB) |
15 ± 5 um |
Diamond Tip
| . |
. |
| Tip Shape |
Cone |
| Radius |
10 ± 5 nm (AS) / < 5 nm (SS) |
| Height |
300 ± 100 nm |
| Tilt Angle |
0 ± 1 degrees |
| Material |
Single Crystal Diamond |
| ½ Angle |
15 ± 2 degrees |
Cantilever Specifications
| . |
. |
. |
. |
. |
. |
Length
± 10 µm |
Width
± 5 µm |
Thickness
± 0.5 µm |
Frequency
(kHz) |
Spring Constant
(N/m) |
Tip Radius
(nm) |
| 225 |
35 |
1.5 |
65 |
2.8 |
10 |
Silicon Probes for Hard Tapping Measurements
The ACTA probes from CSI are silicon probes possessing high spring constant for hard tapping measurements (high force). These probes are designed with high frequency that allows for faster scanning speeds.
Tip Specifications
| . |
. |
| Material |
Si |
| Shape |
Pyramidal |
| Height (µm) |
14-16 |
| Tip ROC |
6 nm (Guaranteed <10 nm) |
Cantilever Specifications
Spring Constant
(N/m) |
Frequency
(kHZ) |
Length
(µm) |
Width
(µm) |
Thickness
(µm) |
| 37 |
300 |
125 |
30 |
4.0 |
Silicon Probes with Low Spring Constant for Soft Tapping Measurements - FORT
CS Instruments have developed the FORTA probes made of silicon. These probes feature a low spring constant which enables their use in soft tapping measurements (low force). They operate at a low frequency and are therefore suitable for measurement of soft samples and liquid measurements.
The technical details are summarized below:
Tip Specifications
| . |
. |
| Material |
Si |
| Shape |
Pyramidal |
| Height (µm) |
14-16 |
| Tip ROC |
6 nm (Guaranteed <10 nm) |
Cantilever Specifications
Spring Constant
(N/m) |
Frequency
(kHZ) |
Length
(µm) |
Width
(µm) |
Thickness
(µm) |
| 1.6 |
61 |
225 |
27 |
2.7 |
4-in-1 Probe Chip with Four Cantilevers - HYDRA-ALL
4 Triangular Silicon Nitride Cantilevers on one chip with different spring constant that allows different forces on the surface
The HYDRA-ALL Probe is a 4-in-1 probe chip with four cantilevers of varying spring constants and lengths. The probe is designed to work with soft materials in a variety of applications.
The technical details are summarized below:
Tip Specifications
| . |
. |
| Material |
Si |
| Shape |
Tetrahedral |
| Height (µm) |
4- 6 |
| Tip ROC (nm) |
<10* |
| Coating |
None |
* Probes with larger tip radius are available upon request
4 Cantilevers on 1 Chip
| . |
Lever A:
6 V-100 N |
Lever B:
6 V-200 N |
Lever C:
6 V-100 W |
Lever D:
6 V-200 W |
| Spring Constant (N/m) |
0.292 |
0.045 |
0.405 |
0.081 |
| Frequency (kHz) |
66 |
17 |
67 |
17 |
| Length (µm) |
100 |
200 |
100 |
200 |
| Width (µm) |
18 |
22 |
25 |
40 |
| Thickness (µm) |
0.6 |
0.6 |
0.6 |
0.6 |
Cr/Co Coating to Match Different MFM Requirements
The MAGT probes from CSI possess medium coercitivity and medium moment magnetic material coating. The MAGT series probes are Cr/Co coating and differ in coercitivity and moment to suit various MFM requirements.
Tip Specifications
| . |
. |
| Coating |
Cr-Co 50 nm |
| Shape |
Pyramidal |
| Height (μm) |
14-16 |
| Tip ROC |
40 nm |
Cantilever Specifications
Spring Constant
(N/m) |
Frequency
(kHZ) |
Length
(μm) |
Width
(μm) |
Thickness
(μm) |
| 3.0 |
62 |
225 |
30 |
3.0 |