Diamond and Silicon Probes for AFM Tips

Highly Conductive Diamond Probe - CS-A-E2.8

CS Instruments produces diamond probes which are highly conductive. These are manufactured using a patented process which yields the greatest possible resistance to wear and the best electrical performance. As a result these tips have improved sharpness and longer life than other electrical AFM probes.

The characteristics of various tips are summarized in the tables below:

Bulk Tip

. .
Tip Shape 4 Sided Pyramid
Height 12.5 ± 2.5 um
Front Angle (FA) 25 ± 5 degrees
Back Angle (SA) 15 ± 5 degrees
Side Angle (SA) 22.5 ± 5 degrees
Tip Setback (TSB) 15 ± 5 um

Diamond Tip

. .
Tip Shape Cone
Radius 10 ± 5 nm (AS) / < 5 nm (SS)
Height 300 ± 100 nm
Tilt Angle 0 ± 1 degrees
Material Single Crystal Diamond
½ Angle 15 ± 2 degrees

Cantilever Specifications

. . . . . .
Length
± 10 µm
Width
± 5 µm
Thickness
± 0.5 µm
Frequency
(kHz)
Spring Constant
(N/m)
Tip Radius
(nm)
225 35 1.5 65 2.8 10

 

Silicon Probes for Hard Tapping Measurements

The ACTA probes from CSI are silicon probes possessing high spring constant for hard tapping measurements (high force). These probes are designed with high frequency that allows for faster scanning speeds.

Tip Specifications

. .
Material Si
Shape Pyramidal
Height (µm) 14-16
Tip ROC 6 nm (Guaranteed <10 nm)

 

Cantilever Specifications

Spring Constant
(N/m)
Frequency
(kHZ)
Length
(µm)
Width
(µm)
Thickness
(µm)
37 300 125 30 4.0

 

Silicon Probes with Low Spring Constant for Soft Tapping Measurements - FORT

CS Instruments have developed the FORTA probes made of silicon. These probes feature a low spring constant which enables their use in soft tapping measurements (low force). They operate at a low frequency and are therefore suitable for measurement of soft samples and liquid measurements.

The technical details are summarized below:

Tip Specifications

. .
Material Si
Shape Pyramidal
Height (µm) 14-16
Tip ROC 6 nm (Guaranteed <10 nm)

Cantilever Specifications

Spring Constant
(N/m)
Frequency
(kHZ)
Length
(µm)
Width
(µm)
Thickness
(µm)
1.6 61 225 27 2.7

 

4-in-1 Probe Chip with Four Cantilevers - HYDRA-ALL

4 Triangular Silicon Nitride Cantilevers on one chip with different spring constant that allows different forces on the surface

The HYDRA-ALL Probe is a 4-in-1 probe chip with four cantilevers of varying spring constants and lengths. The probe is designed to work with soft materials in a variety of applications.

The technical details are summarized below:

Tip Specifications

. .
Material Si
Shape Tetrahedral
Height (µm) 4- 6
Tip ROC (nm) <10*
Coating None

* Probes with larger tip radius are available upon request

4 Cantilevers on 1 Chip

. Lever A:
6 V-100 N
Lever B:
6 V-200 N
Lever C:
6 V-100 W
Lever D:
6 V-200 W
Spring Constant (N/m) 0.292 0.045 0.405 0.081
Frequency (kHz) 66 17 67 17
Length (µm) 100 200 100 200
Width (µm) 18 22 25 40
Thickness (µm) 0.6 0.6 0.6 0.6

 

 

Cr/Co Coating to Match Different MFM Requirements

The MAGT probes from CSI possess medium coercitivity and medium moment magnetic material coating. The MAGT series probes are Cr/Co coating and differ in coercitivity and moment to suit various MFM requirements.

Tip Specifications

. .
Coating Cr-Co 50 nm
Shape Pyramidal
Height (μm) 14-16
Tip ROC 40 nm

 

Cantilever Specifications

Spring Constant
(N/m)
Frequency
(kHZ)
Length
(μm)
Width
(μm)
Thickness
(μm)
3.0 62 225 30 3.0

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