User-Friendly Microscope Thin Film Measurement System
The MProbe MSP is a microscope thin film measurement system that can rapidly measure translucent and/or lightly absorbing films with a great degree of accuracy. These varieties of films include: Oxides, Semiconductors (Si, aSi, polySi), Photoresists, Polymer coatings (Paralene, PMMA, Polyamides), Hard coatings (SiC, DLC), adhesives, Polymers, Nitrates, Compound Semiconductors (AlGaAs, InGaAs, CdTe,CIGS) and thin metal films, along with many others.
- LCD and FPD Applications
- Optical Coatings
- Dielectric filters
- Hardness coatings
- Antireflection coatings
- Biomedical devices
- Orthopedic implants’ coatings
The product features a thickness range from 1 nm – 1.8 mm, with a wavelength range of 200 nm to 1700 nm. Over five hundred items are available in the materials library. Operators can add new materials with ease, and the product supports parameterized materials, including Cauchy, Tauc-Lorentz, Cody-Lorentz and EMA.
The system boasts an adaptable interface which can be used at a desktop or in-situ, along with R&D or inline. A TCP Modbus interface allows for simple integration with an external system. Measurements can be taken with ease on thickness, surface roughness and optical constants, and there is no limit to the number of layers which can be measured.
The system is simple to use, with measurement and analysis carried out through a single click. Despite its straightforward build, it boasts powerful tools, including scaling correction, stimulation and sensitivity, dynamic measurements, background, production batch processing, and linked layers and materials.
Clean room class 1000 design
Thin Film Measurement Using a User-Friendly Microscope System
Measurement of coating thickness on stent
Ease of use and powerful analysis tools Ready for R&D and production application