Posted in | AFM Raman Systems

Hybrid Scanning Mode for AFM

Re-Emergence of Force Spectroscopy: Innovative Electrical, Nanomechanical, Thermal, Optical and Piezoresponse Studies

  • Rapid quantitative nanomechanical measurements as well as force volume
  • Advanced tip-enhanced, cantilever-type Raman scattering as well as scanning near-field optical microscopy
  • Simultaneous non-destructive and electrostatic analyses of piezoresponse, conductivity and thermal studies

on-destructive HybriD PFM study of diphenylalanine peptide nanotubes. From left to right: topography, adhesion, Young’s modulus, and in-plane piezoresponse phase. Scan size: 7 × 7 μm.

Non-destructive HybriD PFM study of diphenylalanine peptide nanotubes. From left to right: topography, adhesion, Young’s modulus, and in-plane piezoresponse phase. Scan size: 7 × 7 μm.

General Information

The HybriD mode, or HD mode, scanning method is based on rapid measurements of force-distance curves using real-time processing of the tip response.

Measured properties:

  • Topography in attractive as well as repulsive systems
  • Tip-enhanced Raman scattering
  • Force volume and Young’s modulus
  • Near-field component of optical response
  • Adhesion as well as work of adhesion
  • Electrostatic—Electrostatic force, Kelvin probe force, and scanning capacitance force microscopy
  • Conductivity
  • Thermal conductivity and temperature
  • In-plane and out-of-plane piezoresponse
  • Thermoelectric

HD mode

Working Principle of the HybriD Mode

The tip-sample distance is modified in HybriD mode based on the quasi-harmonic law, thereby the tip enters a force interaction with the sample at thousands of times per second. Through the analysis of the force-distance curve, maps of the sample’s electrical, nanomechanical, topographical, thermal, and piezoelectric properties can be extracted with reduced lateral forces and high spatial resolution.

Thanks to its specialized algorithms and high-performance electronic components, the most advanced HybriD 2.0 Control Electronics offer an excellent level of signal processing and analysis in real time. The integration of mode with sophisticated optical microscopy and spectroscopy methods paves the way for innovative opportunities of tip-enhanced, cantilever-type Raman scattering (TERS) as well as scattering scanning near-field optical microscopy (s-SNOM).

Hybrid 2.0 Control Electronics

Hybrid 2.0 Control Electronics

Specifications

Parameter Value
High Speed ADC-s 2 × 20 MHz, 16 bit
High Precision ADC-s 4 × 1 MHz, 18 bit
DAC-s 20 × 16 bit 1 MHz
2 × 12 bit 20 MHz
FPGA 120 MHz, Floating Point
DDS (Direct digital synthesizer) 2 × 20 MHz
Lock-in Amplifier Band 4 MHz
High Voltage Amplifier ±150 V, slew rate 32 V/uSec.(limited to 33 kHz at 150 V) small signal bandwidth 500 kHz at < 10 V Amplitude
Number of curves per second Limited only by Z scanner resonance frequency
Common
PC Interface USB 2.0, Ethernet
Program SDK LabView
Power Supply 100-240 V (50/60 Hz)
Set of modes
Topography, Elastic modulus, Lift and Land Adhesion, Work of Adhesion, Current, Force Volume, PFM, KPFM, MFM, EFM

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