DENSsolutions offers the Lightning In Situ TEM Biasing and Heating Series that offers users the ability to achieve real-time data about specimen dynamics, activated by temperature, electric fields, or both.
With the Lightning Series, users can now examine the next-generation nano-electronic materials and devices.
Lightning Application Fields
- ReRam
- Solar cells
- Piezoelectronics
Sample Preparation with Conventional Techniques
Sample preparation methods used for preparing standard TEM samples such as particles, nanowires, and lamellas are well-suited for the Nano-Chip.
FIB lamellas happen to be the most widely used samples for biasing experiments. In association with a few close academic partners, DENSsolutions has created an exclusive FIB workflow using a custom-made FIB stub, particularly developed for the Nano-Chip.
Such a process considerably reduces the overall workflow time and ensures higher success in the transfer. Other techniques like micro-manipulators are well suited for sample preparation onto the Nano-Chip.
Compatibility
- JEOL
- FEI/Thermo Fisher Scientific
In Situ TEM Biasing and Heating
Lightning Sample Holder Tip