FAST-EM Multibeam Electron Microscope

FAST-EM Multibeam Electron Microscope available from Delmic enables users to perform imaging of large and complex samples easily and quickly. Reliable and extremely fast, FAST-EM uses 64 electron beams and is aimed at imaging biological samples without the need to constantly babysit the machine. Download the specifications sheet to learn more about the system.

Robust Solution for Reliable, High-Throughput Electron Microscopy

FAST-EM is an ultra-fast automated multibeam electron microscope (EM) engineered to render large and complex EM projects efficient and simple. Thanks to its automated acquisition, this high-throughput system is well suited to image multiple or large samples for the purposes of quantitative analysis.

The FAST-EM system delivers robust insights while keeping the workflows simple, thus enabling users to better focus on data analysis rather than microscope operation.

The system can be used to analyze the interaction of neuronal circuits, cell architecture, and any biological material in the area of life sciences. It is highly advantageous for large-scale 2D imaging, large-volume 3D imaging, and, generally, as a tool that can considerably accelerate everyday microscopy work at various facilities.

Key Features

Faster Imaging

Thanks to the short dwell times and 64 electron beams users can achieve high acquisition speed.

Focus on Data Analysis

Users can just leave the system to obtain complex datasets automatically without the need for constant supervision.

Realize High Sustained Throughput

The robust automation enables the overhead to be minimized while imaging.

Obtain the Details and the Big Picture

Users can acquire details at the nanoscale while retaining the larger context of the sample.

Rat pancreatic tissue imaged with FAST-EM.

Rat pancreatic tissue imaged with FAST-EM. Image Credit: Sample courtesy of the Giepmans lab. University Medical Center Groningen.

Islet of Langerhans imaged with FAST-EM.

Islet of Langerhans imaged with FAST-EM. Image Credit: Sample courtesy of the Giepmans lab, University Medical Center Groningen.

Publication: Pieter Kruit, Wilco Zuidema. "A Dedicated Multi-Beam SEM for Transmission Imaging of Thin Samples." Microscopy and Microanalysis 25.52 (2019): 1034-1035.

Working with FAST-EM

FAST-EM is the most reliable and high throughput electron microscope that enables users to experience an automated microscopy workflow.

Image with 64 Beams

The FAST-EM system realizes high-throughput imaging by using 64 electron beams that are scanned over the sample in parallel. Then, a fast and high-sensitivity Silicon Photo Multiplier (SiPM) array is used to record the signals. This method helps achieve considerably higher acquisition speeds.

 

FAST-EM Multibeam Electron Microscope

Image Credit: Delmic

Enable Shorter Dwell Times

Scanning Electron Transmission Microscopy (STEM) is employed by the FAST-EM system to form images. This is realized by directly positioning samples on a scintillator screen, which acts as the sample carrier. Localized cathodoluminescence generated by scintillators upon being struck by electrons is captured using optical microscopy.

Next, the resulting light is detected using the Silicon Photo Multiplier (SiPM) array and then processed for final gray-scale image formation. The exclusive detection configuration can be employed to achieve excellent signal-to-noise ratios even at very short dwell times of 400 ns.

FAST-EM Multibeam Electron Microscope

Image Credit: Delmic

Automation Software

Projects for FAST-EM are easily created and managed using easy-to-use software and robust automation.

Thanks to the high reliability of the microscope and the software, operators can leave the system running without the need for constant supervision.

FAST-EM Multibeam Electron Microscope

Image Credit: Delmic

Load Multiple Samples at Once

Sample exchange is one of the elements of EM workflow that causes overhead in a project, requiring the operator to constantly supervise the system. The FAST-EM system enables up to nine substrates to be loaded at the same time, where tens or even hundreds of sections can be held by each substrate. This facilitates continuous imaging for up to 72 hours.

FAST-EM Multibeam Electron Microscope

Image Credit: Delmic

How to Use FAST-EM for Research?

The FAST-EM system is specifically advantageous to analyze any biological material in the area of life sciences, as well as for cell biology, neurobiology, plant biology, histology, biomaterials, and digital pathology.

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