COXEM has expanded its range of sample preparation tools with the introduction of the CP-8000 Cross-Section Polisher.
The CP-8000 polisher employs an argon ion beam that offers precise and clean cross-sections, thus making it an ideal sample preparation tool for SEM, EBSD, EDS, and WDS analysis.
Unlike conventional mechanical polishing that tends to impair the surfaces of fragile specimens, an ion mill works at the molecular level. It prevents distortion or scratches to sample surfaces, thus producing precise and clear imaging. Since chemicals are not used, the sample chemistry remains intact.
The CP-8000 Cross-Section Polisher also features an adjustable accelerating voltage from 1 to 8 kV, has a tilt range of 40° to 80°, and can mill at speeds of up to 500 µm per hour. It can be controlled with an integrated touch panel display and helps prepare large cross-sections that are similar to those of FIB, but at a comparatively lower cost.
For more details, customers can visit the company’s website or contact their local COXEM representative.