Now in its third generation, the PSEM eXplorer is designed for the automated imaging and elemental analysis of a wide spectrum of surfaces and particulate. A unique blend of hardware ruggedization and software sophistication creates a system platform that is readily accessible.
Industrialized by Design
The following founding manufacturing philosophies enable FEI units to be installed where the competition has never been:
- Stability & Reproducibility
- Minimized Downtime
- Reliability & Serviceability
- Evolved Staging
- Environmental Shielding
- Ease of Use
- Guaranteed Performance
Seamless Solutions for Microanalysis
Each FEI PSEM eXplorer comes equipped with the Perception software suite, which provides a powerful set of productivity tools for microanalysis. When coupled with optional FEI software such as ...
- AFA Automated Feature Analysis
- CFA Complex Feature Analysis
- MQA Metal Quality Analysis
- GSR Gun Shot Residue Analysis