The Flex-Mount AFM from Nanosurf AG is a unique AFM that can be customized to obtain high-resolution data on large, non-planar and demanding samples. The Nanosurf FlexAFM scan head’s superior resolution and performance are combined with the integrability of the Nanosurf NaniteAFM in the Flex-Mount solution.
As a result, the AFM can be easily connected to one of Nanosurf’s huge, custom-built motorized translation stages, allowing it to distinguish the surface of samples with weights and dimensions that virtually no other AFM system can manage.
- Verified performance and reliability
- Automated measurements for additional ease-of-use
- Tailored stages to manage large samples of any shape and size
Practical Details That Really Matter in Daily Use
The availability of cantilever holders with magnetic attachments to the scan head makes it simple to replace cantilevers.
Integration systems for use with cantilevers along with alignment grooves are included in the same cantilever holders. This allows for micrometer repositioning precision, thereby avoiding laser alignment, and enabling users to determine the same sample features after the exchange of the cantilever.
Image Credit: Nanosurf AG
Furthermore, the Flex-Mount has an incorporated top view and side view camera, which is very useful during sample approach and positioning since they allow users to accurately coincide the tip with the feature of interest on the sample.
Top view. Image Credit: Nanosurf AG
Side view. Image Credit: Nanosurf AG
Precision and Performance
For XY movement, the Flex-Mount employs a linear electromagnetic scanner. This scanner achieves the highest ranking on the AFM market with an average linearity deviation of less than 0.1% over the entire scan range. The Z-axis is piezo-driven and equipped with a position sensor for closed-loop operation.
A sensitive cantilever detection system can quantify frequencies well into the MHz range. The scan head is linked to the C3000i controller, which has 24-bit resolution, digital feedback and two dual-channel lock-in amplifiers.
Glass Roughness
AFM topography of glass; overview (scan size: 5 µm × 5 µm). Image Credit: Nanosurf AG
AFM topography of glass; details (scan size: 1 µm × 1 µm). Image Credit: Nanosurf AG
Histogram of the topography data. Image Credit: Nanosurf AG
Sa = 313.10 pm, Sq = 393.66 pm, Sy = 4420 pm, Sp = 1981.7 pm, Sv = −2468.6 pm, Sm = −9.313 fm
Silicon Wafer Roughness
AFM topography of a silicon wafer; overview (scan size: 5 µm × 5 µm). Image Credit: Nanosurf AG
AFM topography of a silicon wafer; details (scan size: 1 µm × 1 µm). Image Credit: Nanosurf AG
Histogram of the topography data. Image Credit: Nanosurf AG
Sa = 318.46 pm, Sq = 397.54 pm, Sy = 3335 pm, Sp = 1685.2 pm, Sv = −1670.4 pm, Sm = −19.499 fm
Steps of Strontium Titanate
Topography showing steps of strontium titanate (scan size: 1.1 µm × 1.1 µm). Image Credit: Nanosurf AG
Section profile and height distribution. Image Credit: Nanosurf AG