Park NX-Tip Scan Head addresses nanometrology challenges for samples bigger than 300mm as demand for Atomic Force Metrology for larger flat panel displays grows. The Park NX-Tip TSH’s Scanning Head and gantry-style air-bearing stage allow it to precisely image roughness, step height, and critical dimension measurements.
Park NX-TSH. Image Credit: Park Systems
The most precise and non-destructive way to measure materials at the nanoscale is with atomic force microscopy. Park NX-TSH makes it possible to get dependable, high-resolution AFM images on various surfaces, including photomasks, OLEDs, LCDs, etc.
Park NX-TSH introduction | Industrial AFM for Large & Heavy sample
Video Credit: Park Systems