Posted in | AFM Tips, Probes, Cantilevers

Applied Nanostructures Silicon Probes

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Applied Nanostructures Silicon Probes are available in different configurations such as long and short cantilever for tapping and non-contact mode applications, multi-cantilever probes for force calibration, probes for force modulation microscopy, probes for contact applications and probes with varying degrees of tilt compensation.

Applications

  • Direct optical view of the AFM tip
  • Tapping, contact and non-contact mode applications
  • Spring constant calibration of SPM probes
  • Force Modulation Microscopy
  • Imaging or Trench Depth Metrology.

Other Equipment by this Supplier

Applied Nanostructures Doped Diamond Probes

Applied Nanostructures Doped Diamond Probes
Applied Nanostructures SensaProbes

Applied Nanostructures SensaProbes
Applied Nanostructures Silicon Nitride Probes

Applied Nanostructures Silicon Nitride Probes
Flat Tip AFM Probe from Applied NanoStructures

Flat Tip AFM Probe from Applied NanoStructures

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