NTEGRA Spectra - AFM / Confocal Raman & Fluorescence / SNOM / TERS from NT-MDT

The NTEGRA Spectra is a unique integration of Scanning Probe Microscope and confocal microscopy/luminescence and Raman scattering spectroscopy. Owing to the effect of huge tip enhanced Raman scattering it allows carrying out Raman spectroscopy and obtaining images with resolution up to 50 nm.

Only NTEGRA Spectra provides fully technical integrated with a Renishaw spectrometer solution in terms of software, hardware, and concept for interdisciplinary science at the molecular level. As a result of such union, researchers can obtain optimum efficiency and more time for investigations which allow you to focus on data collection and analysis. So it is safe to say: real integration is better than just a combination.

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Confocal optical microscopy/spectroscopy system
The NTEGRA Spectra nanolaboratory is a system that combines a confocal scanning laser spectrometer, optical microscope and universal scanning probe microscope. The system is capable of working in the mode of registration of spatial 3D distribution of the luminescence spectrum and Raman light scattering, as well as various scanning probe microscopy modes that include nanoindentation, nanomanipulation and nanolithography.

Scanning probe microscopy system
Along with the optical observation, the NTEGRA Spectra allows investigating the object with a set of SPM methods: AFM, MFM, STM, Scanning Near-field Optical Microscopy, Force spectroscopy. The unique combination of optical and probe methods in one device allows carrying out complex experiments, which will provide the researcher with information on the distribution of optical properties and the object’s chemistry overlapped with the mechanical, electrical and magnetic properties data.

System for the investigation of optical properties beyond the diffraction limit
The distinguishing feature of NTEGRA Spectrum nanolaboratory is the capability of studying optical properties of objects beyond the diffraction limits. Scanning Near-field Optical Microscopy and the effect of local tip enhanced Raman scattering provides the researcher with the tools for mapping the optical properties distribution (light transmission, light scattering, light polarization, etc.) as well as carrying out Raman scattering spectroscopy with flat XY resolution up to 50 nm.


Characterization of lithium-ion batteries with AFM-Raman

Characterization of lithium-ion batteries with AFM-RamanLithium batteries, a power source for many portable devices such as cellular phones, laptops, camcorders, etc. are also used in electrical vehicles and aerospace and military applications. The development of lithium batteries is advancing rapidly.

The most valuable methods for structural characterization of the electrodes in rechargeable lithium batteries are Raman spectroscopy and atomic force microscopy (AFM). This application note presents the characterization of a LiCoO2 cathode using AFM and Raman techniques on the NTEGRA Spectra from NT-MDT. AFM and Raman images from the same sample area are captured simultaneously.

Surface analysis of pharmaceutical tables with AFM-Raman

Surface analysis of pharmaceutical tables with AFM-RamanIntegration of Raman spectroscopy with atomic force microscopy opens a broad range of new capabilities in imaging and characterization of pharmaceutical products.

AFM topography offers information on the grain size, shape, orientation and distribution, whilst Raman analysis enables identification of functional groups, chemical compounds and molecular conformers.

Combining these two techniques creates a powerful analytical tool, allowing a huge amount of data to be gathered on pharmaceutical products within a single instrument.

Analysis of multi-junction solar cells with combined AFM and confocal optical spectroscopy

Analysis of multi-junction solar cells with combined AFM and confocal optical spectroscopyMulti-junction solar cells based on nanoheterostructures have some of the highest efficiencies observed. The cells consist of a number of layers of different semiconductor materials, decreasing in bandgap energy from the photosensitive surface to the substrate.

Each layer captures energy from a different segment of the solar spectrum, resulting in very high overall efficiencies - however, the overall efficiency is limited by the worst-performing layer, and characterizing the behaviour of the individual layers in-situ can be challenging.

This study showed that the NTEGRA Spectra can be used to monitor the performance of each subcell separately. The inclusion of AFM capabilities enable a much broader set of diagnostic data to be gathered on the sample compared to using optical spectroscopy techniques alone.

Key publications

  1. Nanoscale Chemical Imaging Using Top-Illumination Tip-Enhanced Raman Spectroscopy. J. Stadler, T. Schmid, and R. Zenobi, Nano Letters (2010) J. Stadler, T. Schmid, R. Zenobi, Nano Letters (2010)

  2. Finding a needle in a chemical haystack: tip-enhanced Raman scattering for studying carbon nanotubes mixtures. A. Chan & S. Kazarian, Nanotechnology 21 (2010) A. Chan, S. Kazarian, Nanotechnology 21 (2010)

  3. Nanoscale Chemical Imaging of Single-Layer Graphene. J. Stadler, T. Schmid, R. Zenobi, American Chemical Society, 2011

  4. Imaging and strain analysis of nano-scale SiGe structures by tip-enhanced Raman spectroscopy. P. Hermann, M.Hecker, D. Chumakov, et al., Ultramicroscopy, 2011

  5. Carbon nanotubes degraded by neutrophil myeloperoxidase induce less pulmonary inflammation. V.Kagan, N. Konduru, W. Feng, et al., Nature Nanotechnology, 2010

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