The EVO® HD features a new electron source technology facilitating unmatched low-kV resolution. This makes the EVO® HD the premier choice for challenging specimens, the imaging of surface detail or for beam-sensitive materials. The resolution improvements at higher probe currents provide enhanced analytical accuracy.
This technology demonstrates unchallenged performance in the conventional SEM (C-SEM) arena and as a result the EVO® HD dramatically improves on the imaging resolution currently achievable in C-SEM. With this step-change in resolution, the EVO® HD now advances knowledge in those applications that were previously limited in conventional SEMs such as :
- Nano Materials
- Fracture Mechanics
- Geological Applications