Posted in | Atomic Force Microscopes (AFM)

Photoconductive AFM (pcAFM) Module for Dimension Icon Atomic Force Microscope from Bruker

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Bruker’s Photoconductive Module for the Dimension Icon® Atomic Force Microscope (AFM) enables quantitative nanoscale electrical characterization of organic photovoltaics (OPVs) at the highest resolution. In addition, the module provides compatibility with both industry-standard Newport solar simulators for uniform sample illumination and Bruker’s AFM Environmental Control 1ppm Turnkey accessory.

Building upon proprietary PeakForce TUNA™ nanoelectrical characterization and the Icon’s industry-best AFM performance, this photoconductive atomic force microscopy (pcAFM) solution provides the highest resolution, most reliable photoconductivity mapping available for soft, fragile samples such as OPV materials.

The Complete Solution for pcAFM

  • Highest resolution conductivity imaging with PeakForce TUNA
  • Correlated quantitative nanomechanical property mapping with PeakForce QNM®
  • Turnkey OPV environmental control with 1ppm glovebox package

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