Specimen Stubs and Mounts for Microscopy

Agar Scientific offers a wide range of SEM specimen stubs and mounts for Focused Ion Beam (FIB) applications. The stubs measure 12.5mm in diameter and 10mm in height, and are supplied individually.

Pin stub versions of SEMClip mounts are also available which can be utilized with all SEMs through pin stubs. They are available in 18 to 50mm diameters. Additionally, SEMClips which are replacement clips and screws are manufactured from a spring grade beryllium-copper alloy. Each clip measures 0.25, 12.7 and 1.6mm in thickness, length and width, respectively.

Other products include FEI-ESEM specimen stubs; Debden Coolstage specimen stubs; rectangular specimen mounts that are precision machined from high quality aluminium; silicon wafers; super smooth, polished silicon mounts; cylinder mount SEMClips for Hitachi SEMs; and low profile aluminium pin stubs.

In addition to these products, Agar Scientific offers a range of 3mm thick carbon discs for mounting specimens. The discs are available in 12.5, 15 and 25mm diameters.

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