7500 Atomic Force Microscope (AFM) from KeySight Technologies

The new Keysight 7500 AFM/SPM displays excellent performance, versatility and ease-of-use for nanoscale characterization, measurement and manipulation.

Outstanding low-noise performance is achieved with the 90µm AFM closed-loop scanner enabling atomic-resolution imaging.

Image Caption:  7500 AFMSurface Potential image of F14H20

Image Caption: 7500 AFM Surface Potential ofConducting Polymer

Key Features

The key features of the 7500 AFM are:

  • It offers excellent closed-loop resolution, environmental and temperature control, and a wide range of electrochemistry capabilities
  • The 7500 scanner’s standard nose cone supports an expanded set of imaging modes, including Keysight’s patented MAC Mode
  • It has easy-to-load nose cones for additional AFM techniques that can be interchanged quickly and conveniently
  • Using Mac Mode III, single-pass nanoscale electrical characterization is achievable

Key Applications

The 7500 AFM is used for the following applications:

  • Materials science
  • Life science
  • Polymer science
  • Electrochemistry
  • Electrical characterization
  • Nanolithography applications

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Keysight 7500 AFM Application Images

Conducting polymer
Capacitance gradient (dC/dZ) image of a conducting polymer on an Au substrate. Scan size: 3μm.
Topography of cell
Topography image of a cell made to characterize cell morphology including nucleus (lower right). Scan size 50 μm.
Elastic modulus of cell
Elasticity map of a fixed cell. An array of force-distance curves were measured at the same position as in the previous image. A map of elasticity modulus was constructed by analyzing the individual force distance curves. Scan size 50 μm.
Surface potential of F14H20
Surface potential image of fluoroalkane (F14H20) self-assembly on Si. Scan size: 4μm.
W/Ti alloy
3-D CS-AFM image of a positive biased sample W/Ti alloy. Current image overlaid on topography image. Scan size: 2μm.

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