Posted in | Nanoanalysis

Inventor of C-Therm's Sensor Tech Wins the Top Award for Innovation

The development of the modified transient plane source technique by C-Therm Technologies (formerly Mathis Instruments) represents a paradigm shift in thermal measurement. The technology is capable of rapidly testing a wide range of materials in measuring thermal conductivity and effusivity (thermal inertia). With virtually no restrictions on sample size, C-Therm's sensor technology allows thermal testing of materials not previously possible. The external sensor can obtain accurate readings from samples as small as 17 mm diameter, with a minimum thickness of 0.5 mm. The maximum sample size and thickness is unlimited.This key advantage has generated broad interest and application of the technology in manufacturing sectors, allowing quality control testing of finished or in-process goods without damaging or disassembling them. For her role in the development of the technology, Dr. Nancy Mathis (original founder of Mathis Instruments) won the coveted Manning Innovation Principal Award in 2003.

Run time: 5.55 mins

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