Posted in | Nanoanalysis

Bruker D8 Discover for Thin Film Analysis

This video shows how the high-resolution Bruker D8 Discover X-ray diffractometer is used for thin-film analysis.

The thickness, lattice constant, crystallographic orientation, and quality of thin films can be determined by the D8 Discover.

Run Time – 3:13min


Tell Us What You Think

Do you have a review, update or anything you would like to add to this video content?

Leave your feedback
Your comment type

Nanotechnology Videos by Subject Matter