are proud to announce the availability of Ambios Q-Scope™ Scanning Probe
Microscope - the industry's most cost-effective, complete, and turnkey SPM/AFM
The Q-Scope™ family of Scanning Probe Microscope (SPM) features a totally
modular design approach which delivers unmatched versatility and utility. Common
to all models are the Q-Scan™ interchangeable scan head and our proprietary
DSP control electronics. Standard Q-Scope models can then be configured using
various sample stages, bases, software and scan accessories to tailor a specific
instrument configuration to meet an individual customer's application requirements.
- Scan Range Choices - Interchangeable Q-Scan™ AFM scanning assemblies
offer scan ranges from submicron to 200µm in X and Y and up to 17µm
- Fast Scan Rates - Scanning can be performed at rates as high as 20Hz, greatly
reducing data acquisition times.
- High Precision Measurements - The Metrology option adds proprietary sensors
to the scan module to accurately measure the precise position of the probe
tip in X, Y, and Z axes. This capability is available on all models and improves
positional precision of the acquired measurements to better than 1%.
- Sample Handling Flexibility - Manual or motorized sample translation stages
are available on the Q-Scope. Sample sizes up to 240mm diameter can be accommodated.
For more information please go to http://www.lot-oriel.com/site/pages_uk_en/products/q-scope/q-scope.php
or contact Heath Young on 01372 378822, e-mail [email protected]