WITec, a manufacturer of
high-resolution Optical and Scanning Probe Microscopy solutions, has introduced
the WITec Project Plus software package for advanced data evaluation and chemometric
It features various tools for multivariate data analysis in the fields of Confocal
Raman Imaging and Scanning Probe Microscopy such as cluster analysis and principal
component analysis. Thus, hidden structures in the images can be visualized
automatically, leading to quick and consistent interpretation of the data. Additionally,
a variety of advanced patent-pending analysis tools and algorithms enable comprehensive
and userfriendly computerized data evaluation and image generation. The speed
with which the extensive calculations behind the various algorithms and procedures
can be executed is unprecedented and provides a new level of capability in analysis
operations. WITec Project Plus can be obtained as an add-on software package
for the WITec Project data evaluation software.
“With WITec Project Plus we provide another software module for unparalleled
unmatched chemical, structural, and optical imaging at the highest resolution.
supports WITec’s philosophy of delivering a single software environment
for a variety of
microscopic techniques, measurement modes and microscope models” says
Koenen, Managing Director at WITec. “Due to the uniqueness of the algorithms
developed, it was clear that patent applications were filed in order to secure
expertise at the forefront of hyperspectral Raman Imaging.”
In Confocal Raman Imaging a complete Raman Spectrum is acquired at each image
pixel resulting in images consisting of tens of thousands of spectra. The WITec
microscope series additionally allows the combination of Raman imaging with
Atomic Force Microscopy for a more comprehensive investigation of a sample.
A sophisticated software package is essential for successful data evaluation
and post-processing. WITec Control for instrument and measurement control and
the WITec Project package provide a software environment from one source for
the various microscopic techniques, measurement modes and microscope models.