Instruments' market leading automated feature and particle analysis system
is now available with new image acquisition hardware INCAmicsF+ for even faster
and more accurate data acquisition.
INCAmicsF+ includes new Fast Response Microprocessor (FRM) technology to detect
smaller particles at least 3x faster. Combined with the revolutionary X-Max
large area silicon drift detector, feature analysis can now be done in a fraction
of the time. Sampling times can now be measured in minutes rather than hours.
"Automated feature detection and analysis in a SEM is an important technique
in many application areas including GSR, steel inclusions, vehicle engines,
disk drives and environmental monitoring," says James Holland, Applications
Manager at Oxford Instruments NanoAnalysis. "Using FeatureMax we have
been able to detect more nano-particles and speed up acquisition by a massive
amount. These gains in accuracy and productivity will offer great benefits in
all these applications and more."