Until the Nanovea HS1000
Profilometer, full automation and the unique advantages of white-light axial
chromatism technique were features rarely found in a single high scanning speed
instrument; a feature the Client requested and only Nanovea could deliver.
Traditional high speed instruments would typically sacrifice one feature for
another, speed or resolution, which limited the users overall measurement capability.
The HS1000 Profilometer stage speed can reach 1m/s, up to 50 times faster than
most optical profilers in its class. The HS1000 Profilometer is equipped with
a 31KHz white-light axial chromatism sensor and XY measurement area of 400mm
x 600mm, which at maximum stage speed can measure 1 point every 32µm and
traverse the full 400mm in less than 1 sec. (higher resolution can be obtained
with proportionally slower stage speeds)
In addition, the HS1000 Profilometer has a machine vision camera option that
allows auto-recognition on precisely chosen surface features with little to
no user interaction. The user-friendly software and the optional machine vision
camera allows for an automatic scan of the surface to recognize all features
of interest. These features can then be automatically measured or the user can
select from a list from which to measure. The combination of superior overall
features makes the HS1000 Profilometer unquestionably the instrument of choice
for high throughput demands found in Semiconductor, Solar and Pharmaceutical
"It goes without saying the importance of gaining this client's choice.
I'm proud of our team's ability to deliver with such an important opportunity,"
said Craig Leising, Product Manager, Nanovea.