Nova Measuring Instruments Ltd. (NASDAQ: NVMI) provider of leading edge stand-alone metrology and the market leader of integrated metrology solutions to the semiconductor process control market, today announced that NovaMARS advanced Scatterometry modeling and analysis software has been chosen as one of 15 best products of 2009 by the editors of Semiconductor International. In the evaluation process, Semiconductor International's editors consider the products based on feedback from actual customers in the field, and only the most highly recommended ones are honored.
NovaMARS features advanced capabilities to model complex 3D semiconductor structures and enables extraction of fine profile details. Recently, the Company announced MatMaker(TM), an extension of NovaMARS, which is a revolutionary material characterization package that can reduce time to solution from days to hours, and improves Optical CD quality.
"We are honored to receive this year's Semiconductor International's Best Product Award," commented Dr. Boaz Brill, VP Technology at Nova. "As semiconductor manufacturers increasingly rely on Optical CD to extract fine profile details that are otherwise undetectable by conventional high volume manufacturing metrology technologies like CD-SEM, the modeling software becomes a critical part of the metrology solution. In NovaMARS, we implemented advanced algorithms that can cope with the complexity of advanced 32nm and 22nm devices on one hand, while shortening time to solution on the other hand. I see NovaMARS as a key to further extending the proliferation of our Optical CD metrology as we continue to innovate and build upon the knowledge and experience we gained working with leading customers."