Posted in | Atomic Force Microscopes

Nanosurf Announce AFM Webinar for Surface Inspection and Defect Analysis

Published on April 24, 2012 at 4:25 AM

From Nanosurf AGApr 24 2012

The Nanosurf LensAFM is an atomic force microscope (AFM) that may be used in conjunction with almost any upright optical microscope or optical profilometer. The combined LensAFM/optical platform provides a complementary imaging system that greatly extends the resolution and measuring capabilities of these individual instruments.

This webinar will highlight:

Ease of adaptation with multiple optical platforms
Synergy and convenience of combining optical and 3D topographical information in the same place
Examples of industrial applications that have benefited from the combined platform

Applications:

Roughness Measurements, Defect Analysis, Edge Radius, Step Heights
Material Properties: Hardness, wear analysis, Conductance/Resistance, Magnetism

Who Should Attend:

Quality Assurance Professionals, Engineers, and Management
Those interested in non-destructive testing
Research and Development Teams
Academic Staff/Students

Please retain the following password: Nsf*123. It will be required to join the webinar.

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