Bruker Introduce Photoconductive Atomic Force Microscopy Module

Bruker today announced the release of the Photoconductive Atomic Force Microscopy (pcAFM) module for its industry leading Dimension Icon platform.

Bruker's Dimension Icon Atomic Force Microscope

The new accessory enables sample illumination while performing nanoscale electrical characterization. In conjunction with Bruker's exclusive PeakForce TUNA technology, it uniquely enables highest resolution photoconductivity and correlated nanomechanical mapping for research on fragile organic light emitting diode (OLED) and organic photovoltaic (OPV) device samples. The pcAFM module is compatible with Bruker's turnkey 1ppm glove box configuration, addressing the most stringent environmental control needs of organic photoelectric materials.

"Organic photoelectric materials are already finding large markets as OLEDs in mobile device displays. There is also interesting research being conducted on OPV devices," said Mark R. Munch, Ph.D., President of Bruker Nano Surfaces Division. "Our new pcAFM accessory transforms the Dimension Icon AFM into a solution for dedicated nanoscale organic photoelectric material research."

"Nanoscale structure and properties are at the core of key OLED and OPV performance parameters," added David V. Rossi, Executive Vice President and General Manager of Bruker's AFM Business. "Our new pcAFM module builds on our exclusive PeakForce Tapping technology to provide the best, highest resolution data advancing organic photoelectric material research."

About the Dimension Icon Photoconductive AFM Module

The Dimension Icon pcAFM accessory is a modular addition to the Dimension Icon platform designed to retain the system's top levels of performance while enabling photoconductivity measurements on OLEDs, OPVs and other photoelectric materials. It provides uniform backside sample illumination and can be fiber coupled to industry-standard solar simulators. In combination with Bruker's exclusive PeakForce TUNA, it addresses the key challenge to avoid sample damage on fragile OLED and OPV samples, thus retaining highest spatial resolution photoconductivity data. It is fully compatible with Bruker's turnkey 1ppm glove box configuration, guaranteeing that measurements are not compromised by environmental material degradation.

Citations

Please use one of the following formats to cite this article in your essay, paper or report:

  • APA

    Bruker Nano Surfaces and Metrology. (2019, February 12). Bruker Introduce Photoconductive Atomic Force Microscopy Module. AZoNano. Retrieved on April 23, 2024 from https://www.azonano.com/news.aspx?newsID=25393.

  • MLA

    Bruker Nano Surfaces and Metrology. "Bruker Introduce Photoconductive Atomic Force Microscopy Module". AZoNano. 23 April 2024. <https://www.azonano.com/news.aspx?newsID=25393>.

  • Chicago

    Bruker Nano Surfaces and Metrology. "Bruker Introduce Photoconductive Atomic Force Microscopy Module". AZoNano. https://www.azonano.com/news.aspx?newsID=25393. (accessed April 23, 2024).

  • Harvard

    Bruker Nano Surfaces and Metrology. 2019. Bruker Introduce Photoconductive Atomic Force Microscopy Module. AZoNano, viewed 23 April 2024, https://www.azonano.com/news.aspx?newsID=25393.

Tell Us What You Think

Do you have a review, update or anything you would like to add to this news story?

Leave your feedback
Your comment type
Submit

While we only use edited and approved content for Azthena answers, it may on occasions provide incorrect responses. Please confirm any data provided with the related suppliers or authors. We do not provide medical advice, if you search for medical information you must always consult a medical professional before acting on any information provided.

Your questions, but not your email details will be shared with OpenAI and retained for 30 days in accordance with their privacy principles.

Please do not ask questions that use sensitive or confidential information.

Read the full Terms & Conditions.