Posted in | Nanomaterials

Xenocs Unveils the Nano-inXider for Nanostructure Characterization at IUCr Congress

Xenocs launched its latest SAXS/WAXS system at the inaugural ceremony of the 23rd IUCr Congress in Montreal.

The Nano-inXider offers unique performance for nanostructure characterization. It integrates all of the key technologies that Xenocs has developed over the last 14 years.

Xenocs CEO, Peter Høghøj   

Launched earlier this year at the inaugural ceremony of the 23rd IUCr Congress in Montreal, the Nano-inXider has a vertical layout and innovative design, marking a clear break from traditional SAXS/WAXS instruments.

The key highlights of the Xenocs’ Nano-inXider are Xenocs Clean Beam Technology, advanced data analysis software and full system control through specially-designed software.

It also features Dectris’ latest generation of detectors.

The Nano-inXider compliments Xenocs' other SAXS/WAXS system, the Xeuss 2.0 laboratory beamline, launched in June at PP2014 in China.

Together, these products are designed to establish Xenocs as a one-stop destination for SAXS/WAXS - whether for researchers new to the technology or experts who need a flexible instrument that they can customize.

Xenocs representatives will be able to answer any queries about these products and recommend the best option based on the individual’s needs. To learn more about the Nano-inXider and other Xenocs product, please click www.xenocs.com.

The launch of the Nano-inXider is a major step in the development of the company. lt is a nice complement to our existing product range broadening our market to users with a need for a compact and easy-to-use system for analyzing their samples at the nanoscale.

Xenocs Executive Vice President Frédéric Bossan   

Watch the video of the Nano-inXider launch event, below, or for more information, visit the Xenocs website.

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