FEI’s Talos scanning transmission electron microscope will be available for demos and workshops at the Indian Institute of Science from 23 November to 15 December 2015.
FEI and ICON Analytical will hold workshops and demonstrations of FEI’s Talos™ scanning transmission electron microscope (STEM) at the Indian Institute of Science, Materials Research Centre in Bangalore, starting 23 November through 15 December 2015.
The industry-leading Talos F200X STEM delivers high-resolution characterization data in two- and three-dimensions. Innovative integration of multiple imaging and analytical modes increases throughput and repeatability without compromising data quality. With Talos, scientists and engineers can acquire statistically meaningful sub-nm data across all research labs in industry, government and academia.
“Talos is a new-generation TEM designed for multi-disciplined laboratories. Our customers will appreciate that new, advanced characterization data can be acquired rapidly and more easily with a lower level of expertise than is typical. Talos can improve productivity by providing sub-nm data to more users in less time, while also reducing training overhead,” states Anand Rao, managing director at ICON Analytical, India.
To schedule a demonstration of the Talos STEM, please contact ICON Analytical: [email protected] or 1.800.103.1423. For more information about the Talos TEM, please visit: http://www.fei.com/talos/.