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  • Bruker Nano Surfaces and Metrology
    Supplier Profile
    Bruker Nano Surfaces and Metrology provides high-performance, specialized analysis and testing technology for the widest range of research and production applications. Our broad portfolio of 2D and...
  • Characterizing Graphene with Atomic Force Microscopy and PeakForce Tapping
    Article - 7 Mar 2016
    Atomic force microscopy is a type of scanning probe microscopy with sub-Ångstrom resolution. It is able to gather data on the mechanical and electrical properties of materials and surfaces by...

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