News - 11 Aug 2020
When nanocellulose is combined with various types of metal nanoparticles, materials are formed with many new and exciting properties. They may be antibacterial, change colour under pressure, or...
News - 23 Jul 2020
KAIST researchers used atomic force microscopy to quantitatively evaluate how acidic and sugary drinks affect human tooth enamel at the nanoscale level.
This novel approach is useful for measuring...
News - 21 Jul 2020
Oxford Instruments Asylum Research announces an upcoming webinar titled “Measuring the Surface Roughness of Thin Films and Substrates with Atomic Force Microscopy.” Surface roughness is a...
News - 1 Jul 2020
Graphene nanoribbons are the thickness of a single carbon atom as well as electrical properties that can exceed those of regular semiconductor technologies. These nanoribbons may lead to a new...
News - 1 Jul 2020
NanoScientific Forum Europe (NSFE 2020) is an annual and open user forum showcasing the research advances in the field of Scanning Probe Microscopy. Submit your abstract by July 31, 2020 and...
News - 26 Jun 2020
Park Systems presents “NanoScientific Symposium on Nano Applications for a Changing World” sponsored by Physics World and Nanotechnology World Association. Park Systems launched this...
News - 25 Jun 2020
As technology shrinks, the need to characterize the properties of very small materials-measured in nanometers (1 nanometer = 1 billionth of a meter)-has become increasingly important.
News - 24 Jun 2020
Park Systems Inc., world-leading manufacturer of Atomic Force Microscopes (AFM) is announcing Park NX-TSH, automated Tip Scan Head for large sample analysis over 300 mm. Park NX-TSH is for large...
News - 18 Jun 2020
The Asylum Research Jupiter XR large-sample AFM and its new Ergo software interface.
Oxford Instruments Asylum Research is pleased to announce that the Jupiter XR atomic force microscope now...
News - 17 Jun 2020
Ludger Weisser, Park Systems General Manager for Europe at their new European Headquarters
Park Systems, a global leader in atomic force microscopy (AFM) announces the opening of a new...