Article - 21 Apr 2005
Scanning Near-Field Optical Microscopes (SNOM or NSOM) offer far greater resolution than traditional optical microscopes. Conducting experiments using SNOM, feedback mechanisms, Photon Scanning...
Article - 25 Aug 2004
Nanoworld have introduced their new Hybid- Nitride probe for atomic force microscopy use in contact mode. Posted August 1 2004
Article - 7 Jun 2006
Increasingly, DAC's are a limiting factor in nanopositioning resolution. A Physik Instrumente patented technology adds up to 10 bits of resolution to virtually any OEM DAC and popular PC analog I/O...
Article - 20 Apr 2005
China is investing heavily in advancing nanotechnology and aims to establish a national information network to co-ordinate R&D activities between academia and industry. This article looks at the...
Article - 24 Aug 2005
Scanning Tunneling Microscopes (STMs) were the first type of microscopes that let scientists study material at the atomic level. The history of STMs, how STMs work, operational techniques, the...
Article - 4 Mar 2005
Experiments performed in microgravity are helping researchers to advance knowledge about nanotechnology. This work is aimed at improving techniques in the gas phase synthesis of nanopowders and...
News - 17 Oct 2017
Bruker has released the NanoMechanics Lab™, a suite of force-mapping modes that enable Dimension FastScan® and Icon® AFM systems to perform quantitative nanoscale characterization,...
News - 18 May 2016
PeakForce sMIM Mode Provides Enhanced Nanoscale Mapping of Permittivity and Conductivity
Bruker’s Nano Surfaces Division today announced the release of scanning microwave impedance microscopy...
News - 3 Sep 2015
Thin films are ubiquitous in materials science and technology, with uses ranging from exotic next generation materials (e.g. ferroelectric data storage) to practical everyday items (e.g. food...
News - 27 Jul 2015
Researchers sometimes struggle to get good images using atomic force microscopy (AFM) because of the complexity of optimizing imaging parameters. The new GetStarted™ feature on Oxford...