Article - 9 Dec 2003
NANOSENSORS have introduced a revolutionary new probe type for Atomic Force Microscopy - the AdvancedTEC™. Posted July 31 2003
Article - 11 Nov 2005
A standard sample of gold colloids suitably immobilized on glass has been shown to be suitable for for Atomic Force Microscopy calibration at the nanoscale, operating in Contact Mode (CM) and Tapping...
Article - 27 Apr 2005
Scanning Probe Microscopy (SPM) is a powerful tool used to study surfaces and surface properties at nanometre resolution. Different operating modes for Scanning Tunneling Microscopes (STM) and Atomic...
Article - 25 Aug 2004
Nanoworld have introduced their new Hybid- Nitride probe for atomic force microscopy use in contact mode. Posted August 1 2004
Article - 7 Jun 2006
Increasingly, DAC's are a limiting factor in nanopositioning resolution. A Physik Instrumente patented technology adds up to 10 bits of resolution to virtually any OEM DAC and popular PC analog I/O...
Article - 20 Apr 2005
China is investing heavily in advancing nanotechnology and aims to establish a national information network to co-ordinate R&D activities between academia and industry. This article looks at the...
Article - 24 Aug 2005
Scanning Tunneling Microscopes (STMs) were the first type of microscopes that let scientists study material at the atomic level. The history of STMs, how STMs work, operational techniques, the...
Article - 4 Mar 2005
Experiments performed in microgravity are helping researchers to advance knowledge about nanotechnology. This work is aimed at improving techniques in the gas phase synthesis of nanopowders and...
Article - 10 Dec 2019
This article discusses how 2D materials can be characterized using AFM.
News - 17 Oct 2017
Bruker has released the NanoMechanics Lab™, a suite of force-mapping modes that enable Dimension FastScan® and Icon® AFM systems to perform quantitative nanoscale characterization,...