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Results 221 - 230 of 309 for AFMs
  • Asylum Research Form Collaboration to Develop New AFM Cantilever Dynamics Techniques
    News - 3 Jul 2007
    Asylum Research, a premier manufacturer of atomic force microscopes (AFMs), has announced its collaboration with Professor Ricardo Garcia’s lab in the Institute of Microelectronics of Madrid to...
  • Veeco Release New Innova Scanning Probe Microscope SPM
    News - 15 Jun 2007
    Veeco Instruments Inc., the world's leading provider of atomic force microscopes (AFMs) for research applications, announced today the release of its new Innova Scanning Probe Microscope (SPM) for...
  • Use of a Higher-Bandwidth AFM for Survey, Screening and Dynamics
    Article - 20 Jun 2012
    There are three key application areas that benefit from a higher-bandwidth Atomic Force Microscope(AFM) with identical data quality, operating cost, force control and convenience of use as a typical...
  • NanoWizard V NanoScience
    Equipment
    This product profile highlights the NanoWizard V NanoScience from Bruker JPK.
  • MFP-3D Origin+ for Full Range of Imaging Modes
    Equipment
    The MFP-3D Origin+ AFM is a high performing and price-competitive tool with a complete range of innovative accessories.
  • The DME CompactGranite AFM System
    Equipment
    The DME CompactGranite is a granite sample stage for SPM. With a modular design that lends itself well to upgrades and additions, the stage enables strong AFM performance whilst maintaining...
  • ProberStation 200—A Large Sample AFM System
    Equipment
    Semilab’s ProberStation 200 large sample SPM stage allows for the automation of AFM measurements while maintaining efficiency and cost-effectiveness. The modular design allows for other important...
  • Beetle UHV VT VMF from RHK
    Equipment
    The VT Beetle from RHK is the most thermally and mechanically stable of the many SPM designs with varying temperature that are currently available on the market.
  • Beetle UHV VT STM from RHK
    Equipment
    RHK’s VT Beetle is based on the field-proven “Johnny Walker” Beetle™ design. It is both thermally and mechanically stable compared to the many SPM designs with varying temperatures that are available...
  • Scanning Probe Microscope (SPM) - Innova from Bruker
    Equipment
    The Innova atomic force microscope from Bruker provides high resolution imaging and a broad range of functionality for application flexibility at a moderate cost - ideal for research use in life...

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