Article - 3 Aug 2015
Erik Runge, Director of Engineering at Minus K Technology, talks to AZoNano about their low-frequency vibration isolation systems.
Article - 26 Mar 2012
Height measurement by AFM is crucial in metrology, however it would also benefit from the capability to perform sidewall roughness imaging.
Article - 15 Apr 2016
Dr. Sang-Joon Cho, Director & Chief Scientist at Park Systems Corp., talks to AZoNano about the SmartScan software.
Article - 8 Dec 2014
In this interview, Dr Curt Sander, founder and CEO of SPM manufacturer DME, talks to AZoNano about the origins of SPM technology.
Article - 1 Apr 2021
Scanning probe microscopy (SPM) is a powerful microscopy technique that allows for the imaging of surface structures at an atomic resolution with sample damage. SPM can also measure other...
Article - 8 Apr 2019
This article discusses atomic force microscopy (AFM) and its applications.
Article - 14 Jul 2020
Sideband KPFM, available on all Park’s NX research tools, offers accurate surface imaging of soft structures.
Article - 20 Jun 2012
There are three key application areas that benefit from a higher-bandwidth Atomic Force Microscope(AFM) with identical data quality, operating cost, force control and convenience of use as a typical...
Article - 3 Mar 2014
In this interview, Dr. Mark R. Munch, president of Bruker Nano Surfaces and Bruker MAT Group, talks to AZoNano about the strategy behind the recent acquisition of Prairie Technologies, and how their...
Article - 25 Mar 2021
Due to it's unique properties, Graphene is of great interest to the electronics industry. Atomic Force Microscopy is a potent method for examining graphene functional properties on a nanoscale level....