Article - 8 Apr 2019
This article discusses atomic force microscopy (AFM) and its applications.
Article - 26 Nov 2013
Asylum Research’s Contact Resonance Viscoelastic Mapping Mode option for the MFP-3D™ and Cypher™ S atomic force microscopes (AFMs) enables high resolution, quantitative imaging of both elastic storage...
Article - 15 Nov 2018
This article discusses the best way to get highest resolution of AFM in air.
Article - 20 Jun 2012
There are three key application areas that benefit from a high-bandwidth Atomic Force Microscope(AFM) with identical data quality, operating cost, force control and convenience of use as a typical...
Article - 3 Mar 2014
In this interview, Dr. Mark R. Munch, president of Bruker Nano Surfaces and Bruker MAT Group, talks to AZoNano about the strategy behind the recent acquisition of Prairie Technologies, and how their...
Article - 4 Oct 2018
Electrical and magnetic properties interact to produce all data storage and logic computing functions known today.
Article - 27 Jul 2017
There is a new form of microscopy available on the marketplace known as photo-induced force microscopy (PiFM), which shows great similarities, and can be used in conjunction, with atomic force...
Article - 12 May 2016
Frequency modulation KPFM (FM- KPFM) and amplitude modulation KPFM (AM-KPFM) are the two critical KPFM detection methods. This article provides an intuitive and geometrically rational probe model to...
Article - 31 Dec 2012
There are a wide range of nanoscale imaging tools that include microscopic methods such as scanning probe microscopy (SPM), electron microscopy (EM), high resolution optical microscopy as well as...
Article - 16 Feb 2019
This article discusses how to measure a 500nm Glass step height using non-contact profilometry with extreme accuracy.