Article - 13 May 2016
Scanning microwave impedance microscopy, also known as sMIM, is an atomic force microscopy (AFM)-based method used for the characterization of materials and devices.
Article - 25 Jan 2016
Thomas Mueller, Director of Development Applications in the AFM business unit of Bruker’s Nano Surfaces Division, talks to AZoNano about Bruker's Dimension FastScan AFM and the benefits of using...
Article - 3 Nov 2015
In this interview, Sergei Magonov, President of NT-MDT Development, talks about the latest developments in the capabilities of NT-MDT’s range of AFMs.
Article - 8 Jan 2015
Adam Kollin, President of RHK Technology, talks to AZoNano about the features and benefits of the Low Temp PanScan.
Article - 2 Jul 2013
AZoNano talks to Sergei Magonov about NT-MDT's HybriD™ AFM Mode, which combines the best aspects of contact and oscillatory modes.
Article - 22 Mar 2013
Iowa, situated in the Midwestern United States, covers a total area of 145,743 km2. As of 2011, it has a population of 3,062,309.
Article - 7 Mar 2013
In AFM, a sharp tip is held at close proximity with a sample using a force-based feedback loop.
Article - 21 May 2012
PeakForce Tapping (PFT) and ScanAsyst (SA) are two Atomic Force Microsocope(AFM) imaging techniques recently introduced by Bruker which fits into the framework of existing AFM modes.
Article - 19 Oct 2011
With co-locataed instruments, researchers can study samples using Raman and SPM techniques providing detailed information about nanoscale properties and composition. TERS promises to push the...
Article - 13 Sep 2010
The initial application of PFM was mainly to image ferroelectric domains significant in a few important.