Article - 3 Nov 2015
In this interview, Sergei Magonov, President of NT-MDT Development, talks about the latest developments in the capabilities of NT-MDT’s range of AFMs.
Article - 8 Jan 2015
Adam Kollin, President of RHK Technology, talks to AZoNano about the features and benefits of the Low Temp PanScan.
Article - 2 Jul 2013
AZoNano talks to Sergei Magonov about NT-MDT's HybriD™ AFM Mode, which combines the best aspects of contact and oscillatory modes.
Article - 22 Mar 2013
Iowa, situated in the Midwestern United States, covers a total area of 145,743 km2. As of 2011, it has a population of 3,062,309.
Article - 7 Mar 2013
In AFM, a sharp tip is held at close proximity with a sample using a force-based feedback loop.
Article - 21 May 2012
PeakForce Tapping (PFT) and ScanAsyst (SA) are two Atomic Force Microsocope(AFM) imaging techniques recently introduced by Bruker which fits into the framework of existing AFM modes.
Article - 19 Oct 2011
With co-locataed instruments, researchers can study samples using Raman and SPM techniques providing detailed information about nanoscale properties and composition. TERS promises to push the...
Article - 13 Sep 2010
The initial application of PFM was mainly to image ferroelectric domains significant in a few important.
Article - 16 Jan 2018
A variety of contact mechanics models can be fitted to the force curves for Nanomechanical measurements.
Article - 17 Jun 2015
After the introduction of the TappingMode™, Bruker’s exclusive PeakForce Tapping® is a very important scientific advancement in atomic force microscope (AFM) technology.