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Results 11 - 20 of 48 for AFMs
  • Plasma Measurements Made Easy with the PSM
    Equipment
    Hiden Analytical’s PSM is a plasma probe that measures some of the key plasma parameters and offers detailed information regarding plasma reaction chemistry.
  • NT-MDT Probes for CONTACT/SEMICONTACT from Scanwel
    Equipment
    Probes for CONTACT/SEMICONTACT modes CSG30 series, resonant frequency 26-76kHz, force constant 0.6-2 N/m. Specially designed for the applications when it's not clearly defined which mode should be...
  • Super Sharp 1nm NT-MDT AFM Probes from Scanwel
    Equipment
    Super sharp diamond-like carbon (DLC) tips with typical curvature radius 1nm are extremely useful for obtaining high resolution on objects with sizes of several nanometers. DLC tips have very long...
  • Pointprobe- Silicon AFM Probes from Nanoworld
    Equipment
    The Pointprobe is a versatile silicon AFM probe for very high resolution imaging and fits to all well-known commercial SPMs (Scanning Probe Microscopes). It consists of a single crystal silicon...
  • Pyrex-Nitride Probe – Diving Board Cantilevers from Nanoworld
    Equipment
    The Pyrex-Nitride probes have silicon nitride cantilevers with very low force constants and integrated oxide sharpened, pyramidal tips with a height of 3.5 µm. The tip is located 4µm behind the free...
  • Applied Nanostructures SensaProbes
    Equipment
    SensaProbes are highly recommended for early stage scans and student use. Applied NanoStructures SensaProbes can be used for tapping and contact mode and force modulation applications.
  • Applied Nanostructures Doped Diamond Probes
    Equipment
    Applied Nanostructures Doped Diamond Probes offers a unique combination of hardness and conducting tip. These probes are nanofabricated using highly doped single crystal silicon with unparalleled...
  • Applied Nanostructures Silicon Nitride Probes
    Equipment
    Applied Nanostructures silicon nitride probes contains the world's first truly hybrid probes. They are also the only commercially available probes that allow for high resolution imaging in fluid...
  • Applied Nanostructures Silicon Probes
    Equipment
    Applied Nanostructures silicon probes are available in different configurations such as long and short cantilever for tapping and non-contact mode applications, multi-cantilever probes for force...
  • Carbon Core High-Resolution (CCHR) AFM Probe from Carbon Design Innovations
    Equipment
    Carbon Design Innovations' (C|D|I) carbon core high-resolution probes (CCHR) atomic force microscopy (AFM) start with a core carbon nanotube (CNT) that is then further processed and stabilized with...

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