Afm - AZoNano Search

Optical Metrology of Patterned Sapphire Substrates for HB-LEDs

Article - 10 Oct 2011

The Zeta-PSS Package offers quick characterization of High-brightness light emitting diodes (HB-LEDs) substrate bump features. Height, width, and pitch are determined in the same scan. .

Nanotechnology and Water Purification

Article - 4 Mar 2010

This article outlined how nanotechnology is being used for water purification. In particular it focuses on biofouling resistant silver-polysulfone composite membrane.

Characterization of Nanoparticle Size and State Prior to Nanotoxicological Studies Using NTA

Article - 22 Dec 2009

This article describes the characterization of nanoparticle size and state prior to nanotoxicological studies using nanoparticle tracking analysis.

Introduction, Application and Challenges of Nanoelectromechanical Systems (NEMS)

Article - 13 Dec 2009

NanoElectroMechanical Systems (NEMS) have critical structural elements at or below 100 nm. This distinguishes them from MicroElectroMechancial Systems (MEMS), where the critical structural elements...

Nanopositioning - Recent Advances Including Parallel Kinematics, Active Trajectory Control, Vibration Suppression and Tracking Error Elimination

Article - 7 Jun 2006

This technote reports on recent advancements in nanopositioning technology, such as parallel kinematics, active trajectory control, new control algorithms for vibration suppression and tracking error...

TMC’s CleanBench™ Industry Standard 63 Series Vibration Isolation Lab Tables

Equipment

TMC has introduced the next generation vibration isolation lab table - CleanBench™ which combines TMC’s Gimbal Piston™ air vibration isolation system and other recent, patent pending, improvements to...

Zeta™-388 Automated Optical Profiler

Equipment

The Zeta-388 is a fully automated optical profiler and wafer metrology system that can handle 100 mm, 150 mm, and 150 mm wafers.

Carbon Nanotubes: Properties and Applications

Article - 10 Jan 2021

Carbon nanotubes possess unique structural, mechanical, and electrical properties. Due to these properties, they play a fundamental role in the field of nanotechnology.

Selection of Application Specific Single and Multi Walled Carbon Nanotubes by In Situ Characterization of Conductive and Field Emission Properties

Article - 14 Nov 2007

The conductive and field emission properties of individual single and multi-walled carbon nanotubes, grown by chemical vapor and supercritical fluid deposition techniques, have been assessed using an...