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  • Team Nanotec GmbH
    Supplier Profile
    Team Nanotec GmbH was founded in 1997 as an IBM Germany spin-off. Our team combines unique research and manufacturing skills with extensive experience in micro- and nanofabrication technology. We...
  • AFM Workshop
    Supplier Profile
    The mission of AFM Workshop is to develop and market innovative AFM products and components for research, development, OEMs and education. They support their customers with workshops on the...
  • Renishaw plc - Spectroscopy
    Supplier Profile
    Renishaw is a global company with core skills in measurement, motion control, additive manufacturing and precision machining. The company also specialises in the production of high quality optical...
  • Bruker’s Hysitron TriboScope®: Enhanced Characterization Capabilities for AFM
    Equipment
    The Hysitron TriboScope® from Bruker delivers quantitative, rigid-probe nanoindentation and nanotribological characterization features to the field of atomic force microscopy.
  • Pointprobe- Silicon AFM Probes from Nanoworld
    Equipment
    The Pointprobe is a versatile silicon AFM probe for very high resolution imaging and fits to all well-known commercial SPMs (Scanning Probe Microscopes). It consists of a single crystal silicon...
  • Carbon Core High-Resolution (CCHR) AFM Probe from Carbon Design Innovations
    Equipment
    Carbon Design Innovations' (C|D|I) carbon core high-resolution probes (CCHR) atomic force microscopy (AFM) start with a core carbon nanotube (CNT) that is then further processed and stabilized with...
  • Carbon Design Innovations Carbon Core High-Aspect Ratio (CCHAR) AFM Probe
    Equipment
    The CCHAR high-aspect ratio CNT AFM probe, are designed for critical dimension measurements and imaging high-Z structures in materials science, metrology and life science applications. The standard...
  • Plateau Tip Silicon-SPM-Probes from NANOSENSORS
    Equipment
    The Plateau Tip series based on the well-established NANOSENSORS™ Silicon-SPM-Probes exhibit an intentionally blunt tip with a well-defined circular end-face located at the free end of a...
  • Coated AFM Tip - Extended Life High Aspect Ratio from Team Nanotec
    Equipment
    Tips are coated with conductive, wear resistent metal carbide. Smooth and well defined tip surface.
  • Super Sharp Silicon AFM Tips from NanoWorld
    Equipment
    NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping™ mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.