Article - 12 Mar 2021
Kelvin Probe Force Microscopy has emerged as a powerful tool for the measurement of surface potential. Sideband KPFM in particular has very high resolution and is thus highly useful for analyzing...
Article - 14 Jul 2020
Sideband KPFM, available on all Park’s NX research tools, offers accurate surface imaging of soft structures.
Article - 3 Nov 2015
In this interview, Sergei Magonov, President of NT-MDT Development, talks about the latest developments in the capabilities of NT-MDT’s range of AFMs.
Article - 2 Jul 2013
AZoNano talks to Sergei Magonov about NT-MDT's HybriD™ AFM Mode, which combines the best aspects of contact and oscillatory modes.
Article - 21 May 2012
PeakForce Tapping (PFT) and ScanAsyst (SA) are two Atomic Force Microsocope(AFM) imaging techniques recently introduced by Bruker which fits into the framework of existing AFM modes.
Article - 2 Mar 2011
By integrating a Raman spectrometer within a state-of-the-art confocal microscope setup, Raman imaging with a spatial resolution down to 200 nm laterally and 500 nm vertically can be achieved using...
Article - 3 Apr 2008
This article explains how to perform advanced nanoscale characterization of polymer materials by employing phase imaging with the Innova.
Article - 25 Feb 2008
This article examines the imaging of organic compounds, both natural and synthetic examples, such as alkanes, alkane derivatives and aromates using atomic force microscopy
Article - 2 Aug 2005
Nanomaterials and nanoparticles are being used in chemical synthesis, especially in the areas of catalysis, separations and remediation.