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Results 11 - 20 of 1099 for Atomic force microscopes
  • Supplier Profile
    Aurora NanoDevices Inc. supplies high quality, calibration systems for atomic force microscopy imaging.  Founded in 2001, our systems are now found in hundreds of scanning probe microscopes...
  • Supplier Profile
    PrimeNano manufactures its own shielded probes. We use a wafer scale MEMS fabrication process to manufacture probes with co-axially shielded cantilevers and solid metal probe tips. The probes are...
  • Supplier Profile
    More than 25 years ago, the foundations of Park Systems were laid at Stanford University, where Dr. Sang-il Park, the founder of Park Systems, worked at Prof. Quate’s group that invented the...
  • Supplier Profile
    Atomic Force Microscopes (AFMs) are versatile instruments that interact with surfaces at the nanometer scale. By "feeling" a sample using a very sharp needle, not unlike the way a record...
  • Supplier Profile
    Bruker Nano Surfaces provides high-performance, specialized analysis and testing technology for the widest range of research and production applications. Our broad portfolio of 2D and 3D surface...
  • Supplier Profile
    Molecular Nanosystems' goal is to develop nanotube-based gas, chemical and bio-sensors and other high-end electronics devices. The company's suite of nanotube-based products is intended...
  • Supplier Profile
    CSInstruments is a French scientific equipment manufacturer specialized in the conception of Atomic Force Microscope and options designed for existing AFM (Resiscope, High Voltage Amplifier, Magnetic...
  • Supplier Profile
    For over 20 years, DME has successfully dealt with the development and manufacturing of atomic force microscopes. In this connection DME's key points are easy usability, manufacturing by...
  • Supplier Profile
    Over the last 25 years, NT-MDT has been involved in the development, production and support of research instrumentation, primarily, atomic force microscopes (AFM) and its combinations with ultrahigh...
  • Article - 28 Oct 2005
    Nanosensors have announced the Q30K-Plus, a novel scanning proximity probe with an outstanding Q-factor and enhanced signal to noise ratio for UHV applications. Posted October 28 2005