Article - 24 Aug 2005
As Scanning Probe Microscopes (SPM) and Atomic Force Microscopes (AFM) are still evolving, manufacturers are keen to protect their work by patenting many of the design changes. Which companies hold...
Article - 25 Aug 2004
Nanoworld have introduced their new Hybid- Nitride probe for atomic force microscopy use in contact mode. Posted August 1 2004
Article - 13 May 2004
The atomic force microscope (AFM), together with the scanning tunneling microscope (STM), was invented in 1986 by Binnig, Quate, and Gerber.
Article - 13 Nov 2003
Applied NanoMaterials, Inc. has announced that it will manufacture a new kind of inorganic nanotube for products such as advanced generation high resolution flat panel displays and atomic force...
Article - 24 Aug 2006
Using Atomic Force Microscopy and Scanning Tunneling Microscopy (STM) for the control and manipulation of submicron systems.
Article - 21 Jul 2006
It is essential to have the tools that enable the maker to see, control, and engineer at the atomic level, before making anything.
Article - 27 Apr 2005
Scanning Probe Microscopy (SPM) is a powerful tool used to study surfaces and surface properties at nanometre resolution. Different operating modes for Scanning Tunneling Microscopes (STM) and Atomic...
Article - 20 Apr 2005
China is investing heavily in advancing nanotechnology and aims to establish a national information network to co-ordinate R&D activities between academia and industry. This article looks at the...
Article - 2 Mar 2004
This article discusses the similarities and differences between atomic force microscopy (AFM) And transmission electron microscopy (TEM).
Article - 9 Dec 2003
NANOSENSORS have introduced a revolutionary new probe type for Atomic Force Microscopy - the AdvancedTEC™. Posted July 31 2003